BS IEC 62860:2013 - Test methods for the characterization of organic transistors and materials

BS IEC 62860:2013

Test methods for the characterization of organic transistors and materials

Status : Current   Published : August 2014

Format
PDF

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HARDCOPY



IEC 62860:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors. Keywords: electrical characterization, FET, flexible electronics, high impedance, nanocomposite, nanotechnology, OFET, organic electronics, organic transistor, printed electronics, printing, transistor




Standard NumberBS IEC 62860:2013
TitleTest methods for the characterization of organic transistors and materials
StatusCurrent
Publication Date31 August 2014
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)IEEE 100
International RelationshipsIEC 62860:2013
DescriptorsElectronic equipment and components, Organic chemistry, Optoelectronic devices, Semiconductor devices
ICS07.030
07.120
CommitteeNTI/1
ISBN978 0 580 82727 3
PublisherBSI
FormatA4
DeliveryYes
Pages28
File Size1.048 MB
Price£186.00


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