BS EN IEC 60749-18:2019 - TC - Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Ionizing radiation (total dose)

BS EN IEC 60749-18:2019 - TC

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Ionizing radiation (total dose)

Status : Current   Published : November 2020

Format
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Standard NumberBS EN IEC 60749-18:2019 - TC
TitleTracked Changes. Semiconductor devices. Mechanical and climatic test methods. Ionizing radiation (total dose)
StatusCurrent
Publication Date03 November 2020
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)ASTM E 666, ASTM 51275, MIL-STD-883J, ASTM E 1250, ASTM F 1892:2018, ASTM E 1249, ASTM E 668
Amended ByCorrigendum, October 2020
DescriptorsGamma-radiation, Semiconductor devices, Cobalt, Climate, Environmental testing, Annealing, Electronic equipment and components, Integrated circuits, Mechanical testing, Military engineering, Ionizing radiation, Space technology
ICS13.110
25.040.99
29.020
31.080.01
ISBN978 0 539 15731 4
PublisherBSI
FormatA4
DeliveryYes
Pages54
File Size1.821 MB
Price£262.00


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