PD IEC TS 61994-4-4:2018 - TC - Tracked Changes. Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary. Piezoelectric materials. Single crystal wafers for surface acoustic wave (SAW) devices

PD IEC TS 61994-4-4:2018 - TC

Tracked Changes. Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary. Piezoelectric materials. Single crystal wafers for surface acoustic wave (SAW) devices

Status : Current   Published : February 2020

Format
PDF






Standard NumberPD IEC TS 61994-4-4:2018 - TC
TitleTracked Changes. Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary. Piezoelectric materials. Single crystal wafers for surface acoustic wave (SAW) devices
StatusCurrent
Publication Date27 February 2020
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)IEC 62276:2016
DescriptorsAcoustic wave devices, Piezoelectric materials, Frequency control, Dielectric devices, Vocabulary, Terminology, Quartz, Piezoelectric crystals, Crystal resonators, Electronic equipment and components, Piezoelectric devices
ICS01.040.31
31.140
CommitteeEPL/49
ISBN978 0 539 11834 6
PublisherBSI
FormatA4
DeliveryYes
Pages40
File Size1.698 MB
Price£169.00


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