BS ISO 25498:2018 - TC - Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope

BS ISO 25498:2018 - TC

Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope

Status : Current   Published : February 2020

Format
PDF






Standard NumberBS ISO 25498:2018 - TC
TitleTracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
StatusCurrent
Publication Date27 February 2020
Normative References(Required to achieve compliance to this standard)ISO/IEC 17025
Informative References(Provided for Information)ISO 15932:2013, ASTM E 3-11
DescriptorsSpectroscopy, Microanalysis, Optical instruments, Electron beams, Electron diffraction, Test specimens, Crystal lattices, Electron microscopes, Chemical analysis and testing
ICS71.040.50
CommitteeCII/9
ISBN978 0 539 11605 2
PublisherBSI
FormatA4
DeliveryYes
Pages116
File Size5.76 MB
Price£312.00


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