BS ISO 16700:2016 - TC - Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

BS ISO 16700:2016 - TC

Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

Status : Current   Published : February 2020

Format
PDF






Standard NumberBS ISO 16700:2016 - TC
TitleTracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
StatusCurrent
Publication Date26 February 2020
Normative References(Required to achieve compliance to this standard)ISO/IEC 17025:2005, ISO Guide 30, ISO Guide 34, ISO Guide 35
Informative References(Provided for Information)ISO 5725-1, GUM:1995, ISO/IEC Guide 98-3
DescriptorsElectron optics, Accuracy, Electron beams, Calibration, Electron microscopes, Magnification, Control samples, Microscopes, Optical instruments, Optical phenomena, Scanning electron microscopes
ICS37.020
CommitteeCII/9
ISBN978 0 539 10715 9
PublisherBSI
FormatA4
DeliveryYes
Pages58
File Size3.981 MB
Price£236.60


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