ASTM E2627 - 13(2019) - Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials

ASTM E2627 - 13(2019)

Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials

Status : Current   Published : November 2019

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1.1 This practice is used to determine grain size from measurements of grain areas from automated electron backscatter diffraction (EBSD) scans of polycrystalline materials.

1.2 The intent of this practice is to standardize operation of an automated EBSD instrument to measure ASTM G directly from crystal orientation. The guidelines and caveats of E112 apply here, but the focus of this standard is on EBSD practice.

1.3 This practice is only applicable to fully recrystallized materials.

1.4 This practice is applicable to any crystalline material which produces EBSD patterns of sufficient quality that a high percentage of the patterns can be reliably indexed using automated indexing software.

1.5 The practice is applicable to any type of grain structure or grain size distribution.

1.6 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.7  This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.8  This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.




Standard NumberASTM E2627 - 13(2019)
TitleStandard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
StatusCurrent
Publication Date01 November 2019
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Descriptors backscattered electrons, backscatter diffraction, EBSD, Grain size, Kikuchi pattern, orientation map, SEM, scanning electron microscope
ICS71.040.50
PublisherASTM
FormatA4
DeliveryYes
Pages5
File Size88 KB
Price£40.00


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