BS EN IEC 60749-17:2019 - TC - Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation

BS EN IEC 60749-17:2019 - TC

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation

Status : Current   Published : February 2020

Format
PDF






Standard NumberBS EN IEC 60749-17:2019 - TC
TitleTracked Changes. Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation
StatusCurrent
Publication Date24 February 2020
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
DescriptorsSemiconductor devices, Climate, Radiation measurement, Military equipment, Neutrons, Electronic equipment and components, Dosimeters, Nuclear particles, Mechanical testing, Irradiation, Degradation, Space technology components, Environmental testing, Destructive testing, Integrated circuits, Military engineering
ICS31.080.01
CommitteeEPL/47
ISBN978-0-539-07871-8
PublisherBSI
FormatA4
DeliveryYes
Pages28
File Size1.783 MB
Price£143.00


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