ASTM E766 - 14(2019) - Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

ASTM E766 - 14(2019)

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

Status : Current   Published : November 2019

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1.1 This practice covers general procedures necessary for the calibration of magnification of scanning electron microscopes. The relationship between true magnification and indicated magnification is a complicated function of operating conditions. 2 Therefore, this practice must be applied to each set of standard operating conditions to be used.

1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3  This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.4  This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.




Standard NumberASTM E766 - 14(2019)
TitleStandard Practice for Calibrating the Magnification of a Scanning Electron Microscope
StatusCurrent
Publication Date01 November 2019
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Descriptors calibration, magnification, pitch, scanning electron microscope, SEM
ICS37.020
PublisherASTM
FormatA4
DeliveryYes
Pages6
File Size198 KB
Price£40.00


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