20/30405217 DC - BS EN IEC 62047-40. Semiconductor devices. Micro-electromechanical devices. Part 40. Test methods of Micro-electromechanical inertial shock switch threshold

20/30405217 DC

BS EN IEC 62047-40. Semiconductor devices. Micro-electromechanical devices. Part 40. Test methods of Micro-electromechanical inertial shock switch threshold

Status : Current, Draft for public comment   Published : June 2020

Format
PDF

Format
HARDCOPY






Standard Number20/30405217 DC
TitleBS EN IEC 62047-40. Semiconductor devices. Micro-electromechanical devices. Part 40. Test methods of Micro-electromechanical inertial shock switch threshold
StatusCurrent, Draft for public comment
Publication Date05 June 2020
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC 62047-40 Ed.1.0
Draft Expiry Date29 July 2020
DescriptorsTest methods, Semiconductor technology, Electronic equipment and components, Electromechanical devices, Semiconductor devices, Integrated circuits
ICS31.080.99
CommitteeEPL/47
PublisherBSI
FormatA4
DeliveryYes
Pages11
File Size345 KB
NotesWarning: this draft is not current beyond its expiry date for comments.
Price£20.00


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