19/30394914 DC - BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)

19/30394914 DC

BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)

Status : Current, Draft for public comment   Published : December 2019

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Standard Number19/30394914 DC
TitleBS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
StatusCurrent, Draft for public comment
Publication Date19 December 2019
Normative References(Required to achieve compliance to this standard)ISO 22493, ISO 23833
Informative References(Provided for Information)ISO 22309, ISO/IEC 17025, ASTM E1508, IEC 60759, ISO 18115-1
International RelationshipsISO/DIS 15632
Draft Expiry Date04 February 2020
DescriptorsSpectroscopy, Electron beams, Chemical analysis and testing, Detectors, Semiconductor diodes, Semiconductors, X-ray fluorescence spectrometry
ICS71.040.99
Title in FrenchAnalyse par microfaisceaux. Paramètres de performance instrumentale sélectionnés pour la spécification et le contrôle des spectromètres X à sélection d'énergie utilisés en microanalyse par sonde à électrons
CommitteeCII/9
PublisherBSI
FormatA4
DeliveryYes
Pages20
File Size717 KB
NotesWarning: this draft is not current beyond its expiry date for comments.
Price£20.00


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