19/30394481 DC - BS EN IEC 60749-30. Semiconductor devices. Mechanical and climatic test methods. Part 30. Preconditioning of non-hermetic surface mount devices prior to reliability testing

19/30394481 DC

BS EN IEC 60749-30. Semiconductor devices. Mechanical and climatic test methods. Part 30. Preconditioning of non-hermetic surface mount devices prior to reliability testing

Status : Current, Draft for public comment   Published : May 2019

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Standard Number19/30394481 DC
TitleBS EN IEC 60749-30. Semiconductor devices. Mechanical and climatic test methods. Part 30. Preconditioning of non-hermetic surface mount devices prior to reliability testing
StatusCurrent, Draft for public comment
Publication Date28 May 2019
Normative References(Required to achieve compliance to this standard)IEC 60749-25:2003, IEC 60749-4, IEC 60749-33, IEC 60749-24, IEC 60749-5, IEC 60749-11
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC 60749-30 Ed.2.0
Draft Expiry Date16 July 2019
DescriptorsSurface mounting devices, Reliability, Climate, Semiconductor devices, Electronic equipment and components, Environmental testing, Specimen preparation, Mechanical testing, Integrated circuits, Performance testing
ICS31.080.01
Title in FrenchIEC 60749-30 ED2: Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 30:
CommitteeEPL/47
PublisherBSI
FormatA4
DeliveryYes
Pages15
File Size265 KB
NotesWarning: this draft is not current beyond its expiry date for comments.
Price£20.00


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