19/30393421 DC - BS EN IEC 62899-503-3. Printed electronics. Part 503-3. Quality assessment. Measuring method of contact resistance for the printed thin film transistor by transfer length method

19/30393421 DC

BS EN IEC 62899-503-3. Printed electronics. Part 503-3. Quality assessment. Measuring method of contact resistance for the printed thin film transistor by transfer length method

Status : Current, Draft for public comment   Published : August 2019

Format
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Format
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Standard Number19/30393421 DC
TitleBS EN IEC 62899-503-3. Printed electronics. Part 503-3. Quality assessment. Measuring method of contact resistance for the printed thin film transistor by transfer length method
StatusCurrent, Draft for public comment
Publication Date16 August 2019
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)IEC 60512-2-2:2003
International RelationshipsIEC 62899-503-3 Ed.1.0
Draft Expiry Date04 September 2019
DescriptorsElectronic devices, LED, Electronic equipment and components, Testing, Test equipment
ICS29.220.10
29.220.30
29.220.99
CommitteeAMT/9
PublisherBSI
FormatA4
DeliveryYes
Pages13
File Size479 KB
NotesWarning: this draft is not current beyond its expiry date for comments.
Price£20.00


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