19/30390371 DC - BS IEC 60747-14-11. Semiconductor devices. Part 14-11. Semiconductor sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

19/30390371 DC

BS IEC 60747-14-11. Semiconductor devices. Part 14-11. Semiconductor sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

Status : Current, Draft for public comment   Published : January 2019

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Format
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Standard Number19/30390371 DC
TitleBS IEC 60747-14-11. Semiconductor devices. Part 14-11. Semiconductor sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature
StatusCurrent, Draft for public comment
Publication Date23 January 2019
Normative References(Required to achieve compliance to this standard)IEC 63041-1, IEC 63041-2
Informative References(Provided for Information)IEC 63041-1:2017, IEC 63041-2:2017
International RelationshipsIEC 60747-14-11 Ed.1.0
Draft Expiry Date06 February 2019
DescriptorsEnvironmental testing, Electronic equipment and components, Moisture measurement, Semiconductor devices, Water vapour, Mechanical testing, Water-vapour tests, Climate, Integrated circuits
ICS31.080.01
CommitteeEPL/47
PublisherBSI
FormatA4
DeliveryYes
Pages28
File Size2.437 MB
NotesWarning: this draft is not current beyond its expiry date for comments.
Price£20.00


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