BS IEC 60747-5-11:2019 - Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes

BS IEC 60747-5-11:2019

Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes

Status : Current   Published : January 2020

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IEC 60747-5-11:2019(E) specifies the measuring methods of radiative and nonradiative currents of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the internal quantum efficiency (IQE) as a function of current, whose measurement methods are discussed in other documents.




Standard NumberBS IEC 60747-5-11:2019
TitleSemiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes
StatusCurrent
Publication Date14 January 2020
Normative References(Required to achieve compliance to this standard)IEC 60747-5-6:2016
Informative References(Provided for Information)IEC 60747-5-8:2019, IEC 60747-5-9, IEC 60747-5-10
International RelationshipsIEC 60747-5-11:2019
Draft Superseded By18/30388245 DC
DescriptorsMeasurement, Test methods, Light-emitting diodes, Optoelectronic devices, Semiconductor devices
ICS31.080.99
CommitteeEPL/47
ISBN978 0 539 03263 5
PublisherBSI
FormatA4
DeliveryYes
Pages16
File Size1.001 MB
Price£130.00


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