18/30386543 DC - BS EN 63229 Ed.1.0. Semiconductor devices. The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate
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18/30386543 DC

BS EN 63229 Ed.1.0. Semiconductor devices. The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate

Status : Current, Draft for public comment   Published : December 2018

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PDF

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HARDCOPY






Standard Number18/30386543 DC
TitleBS EN 63229 Ed.1.0. Semiconductor devices. The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate
StatusCurrent, Draft for public comment
Publication Date11 December 2018
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC 63229 Ed.1.0
Draft Expiry Date24 June 2020
DescriptorsSubstrates (insulating), Electrical equipment, Computer hardware, Components, Electrical components, Computer components, Common terms, Electronic equipment and components, Semiconductor technology
ICS31.080
31.080.01
CommitteeEPL/47
PublisherBSI
FormatA4
DeliveryYes
Pages28
File Size2.813 MB
NotesWarning: this draft is not current beyond its expiry date for comments.
Price£20.00


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