Standard Number | 18/30381548 DC |
Title | BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET). Part 1. Fast BTI Test method |
Status | Current, Draft for public comment |
Publication Date | 03 August 2018 |
Normative References(Required to achieve compliance to this standard) | IEC 62417 |
Informative References(Provided for Information) | JEITA ED-4704A, JEDEC JESD241 |
International Relationships | IEC 62373-1 Ed.1.0 |
Draft Expiry Date | 12 September 2018 |
Descriptors | Testing conditions, Semiconductors, Voltage measurement, Electronic equipment and components, Temperature, Transistors, Metal oxide semiconductors, Semiconductor devices |
ICS | 31.080.30
|
Committee | EPL/47 |
Publisher | BSI |
Format | A4 |
Delivery | Yes |
Pages | 17 |
File Size | 628 KB |
Notes | Warning: this draft is not current beyond its expiry date for comments. |
Price | £20.00 |