ASTM F1893 - 18 - Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

ASTM F1893 - 18

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

Status : Current   Published : March 2018

Format
PDF

Format
HARDCOPY



1.1 This guide defines the detailed requirements for testing semiconductor devices for short-pulse high dose-rate ionization-induced survivability and burnout failure. The test facility shall be capable of providing the necessary dose rates to perform the measurements. Typically, large flash X-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are utilized because of their high dose-rate capabilities. Electron Linear Accelerators (LINACs) may be used if the dose rate is sufficient. Two modes of test are described: ( 1) A survivability test, and ( 2) A burnout failure level test.

1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.

1.3  This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.




Standard NumberASTM F1893 - 18
TitleGuide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
StatusCurrent
Publication Date01 March 2018
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Descriptors Burnout, failure, high dose-rate, integrated circuits, ionizing radiation, latchup, microcircuits, semiconductor devices, survivability
ICS31.080.01
PublisherASTM
FormatA4
DeliveryYes
Pages7
File Size89 KB
Price£40.00


 Your basket
Your basket is empty

Multi-user access to over 3,500 medical device standards, regulations, expert commentaries and other documents


Collaborate, Innovate, Accelerate.


BSOL

The faster, easier way to work with standards


Tracked Changes

Understand the changes made to a standard with our new Tracked Changes version