ASTM F1190 - 18 - Standard Guide for Neutron Irradiation of Unbiased Electronic Components

ASTM F1190 - 18

Standard Guide for Neutron Irradiation of Unbiased Electronic Components

Status : Current   Published : March 2018



1.1 This guide strictly applies only to the exposure of unbiased silicon (Si) or gallium arsenide (GaAs) semiconductor components (integrated circuits, transistors, and diodes) to neutron radiation to determine the permanent damage in the components. Validated 1-MeV displacement damage functions codified in National Standards are not currently available for other semiconductor materials.

1.2 Elements of this guide, with the deviations noted, may also be applicable to the exposure of semiconductors comprised of other materials except that validated 1-MeV displacement damage functions codified in National standards are not currently available.

1.3 Only the conditions of exposure are addressed in this guide. The effects of radiation on the test sample should be determined using appropriate electrical test methods.

1.4 This guide addresses those issues and concerns pertaining to irradiations with neutrons.

1.5 System and subsystem exposures and test methods are not included in this guide.

1.6 The range of interest for neutron fluence in displacement damage semiconductor testing range from approximately 10 9 to 10 16 1-MeV n/cm 2.

1.7 This guide does not address neutron-induced single or multiple neutron event effects or transient annealing.

1.8 This guide provides an alternative to Test Method 1017, Neutron Displacement Testing, a component of MIL-STD-883 and MIL-STD-750.

1.9  This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.10  This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Standard NumberASTM F1190 - 18
TitleStandard Guide for Neutron Irradiation of Unbiased Electronic Components
Publication Date01 March 2018
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Descriptors TRIGA-type reactor, thermoluminescent dosimeter (TLD), sulfur, silicon, semiconductor, reactor, radiation, 1 MeV equivalent fluence, nickel, neutron flux, neutron fluence, irradiation, gamma effects, gamma dose, gallium arsenide, fast burst reactor (FBR), equivalent monoenergetic neutron fluence, electronic component, Dosimetry
File Size104 KB

 Your basket
Your basket is empty

Multi-user access to over 3,500 medical device standards, regulations, expert commentaries and other documents


Access, view and download standards with multiple user access, across multiple sites with BSOL

Worldwide Standards
We can source any standard from anywhere in the world

Develop a PAS

Develop a fast-track standardization document in 9-12 months