BS EN IEC 60749-18:2019 - Semiconductor devices. Mechanical and climatic test methods. Ionizing radiation (total dose)

BS EN IEC 60749-18:2019

Semiconductor devices. Mechanical and climatic test methods. Ionizing radiation (total dose)

Status : Current   Published : June 2019



IEC 60749-18:2019 is available as

IEC 60749-18:2019 RLV

which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used. This document addresses only steady-state irradiations, and is not applicable to pulse type irradiations. It is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition:

- updates to subclauses to better align the test method with MIL-STD 883J, method 1019, including the use of enhanced low dose rate sensitivity (ELDRS) testing;

- addition of a Bibliography, which includes ASTM standards relevant to this test method.

Standard NumberBS EN IEC 60749-18:2019
TitleSemiconductor devices. Mechanical and climatic test methods. Ionizing radiation (total dose)
Publication Date10 June 2019
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)ASTM E 668, ASTM E 666, ASTM E 1250, ISO/ASTM 51275, ASTM F 1892:2018, MIL-STD-883J, ASTM E 1249
ReplacesBS EN 60749-18:2003
International RelationshipsEN IEC 60749-18:2019,IEC 60749-18:2019
Draft Superseded By18/30374539 DC
DescriptorsIntegrated circuits, Annealing, Gamma-radiation, Semiconductor devices, Space technology, Climate, Environmental testing, Military engineering, Ionizing radiation, Cobalt, Mechanical testing, Electronic equipment and components
Title in FrenchDispositifs à semiconducteurs. Méthodes d’essais mécaniques et climatiques Rayonnements ionisants (dose totale)
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Prüfverfahren Ionisierende Strahlung (Gesamtdosis)
ISBN978 0 539 00234 8
File Size1.303 MB

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