BS EN IEC 60749-17:2019 Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation

BS EN IEC 60749-17:2019

Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation

Status : Current   Published : May 2019

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PDF

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HARDCOPY



What is this standard about?

The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.

The objectives of the test are as follows:

a) to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, and

b) to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence.




Standard NumberBS EN IEC 60749-17:2019
TitleSemiconductor devices. Mechanical and climatic test methods. Neutron irradiation
StatusCurrent
Publication Date15 May 2019
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)ASTM E 265, ASTM E 264, ASTM E 263, ASTM E 721, MIL-STD-883, ASTM E 1018, ASTM E 722, ASTM E 720, ASTM E 668, ASTM E 2450
ReplacesBS EN 60749-17:2003
International RelationshipsEN IEC 60749-17:2019,IEC 60749-17:2019
Draft Superseded By18/30373809 DC
DescriptorsNeutrons, Nuclear particles, Semiconductor devices, Mechanical testing, Dosimeters, Integrated circuits, Destructive testing, Degradation, Military engineering, Military equipment, Climate, Radiation measurement, Irradiation, Space technology components, Electronic equipment and components, Environmental testing
ICS31.080.01
Title in FrenchDispositifs à semiconducteurs. Méthodes d’essais mécaniques et climatiques Irradiation aux neutrons
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Prüfverfahren Neutronenbestrahlung
CommitteeEPL/47
ISBN978 0 539 00062 7
PublisherBSI
FormatA4
DeliveryYes
Pages14
File Size869 KB
Price£110.00


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