Standard Number | 19/30364443 DC |
Title | BS EN IEC 62047-35. Semiconductor devices. Micro-electromechanical devices. Part 35. Test method of electrical characteristics under bending deformation for flexible and foldable electro-mechanical devices |
Status | Current, Draft for public comment |
Publication Date | 04 January 2019 |
Normative References(Required to achieve compliance to this standard) | No other standards are normatively referenced |
Informative References(Provided for Information) | No other standards are informatively referenced |
International Relationships | FprEN IEC 62047-35:2019,IEC 62047-35:2019 |
Draft Expiry Date | 13 February 2019 |
Descriptors | Semiconductor technology, Electromechanical devices, Deformation, Test methods, Semiconductor devices |
ICS | 31.080.99
|
Title in French | IEC 62047-35 ED1: Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 35 : |
Committee | EPL/47 |
Publisher | BSI |
Format | A4 |
Delivery | Yes |
Pages | 19 |
File Size | 494 KB |
Notes | Warning: this draft is not current beyond its expiry date for comments. |
Price | £20.00 |