18/30362458 DC - BS IEC 60747-14-11. Semiconductor devices. Part 14-11. Semiconductor sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

18/30362458 DC

BS IEC 60747-14-11. Semiconductor devices. Part 14-11. Semiconductor sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

Status : Current, Draft for public comment   Published : June 2018

Format
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Standard Number18/30362458 DC
TitleBS IEC 60747-14-11. Semiconductor devices. Part 14-11. Semiconductor sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature
StatusCurrent, Draft for public comment
Publication Date22 June 2018
Normative References(Required to achieve compliance to this standard)IEC 62761, IEC 62276, IEC TS 61994-4-4
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC 60747-14-11 Ed.1.0
Draft Expiry Date20 November 2019
DescriptorsSemiconductor devices, Water-vapour tests, Mechanical testing, Environmental testing, Electronic equipment and components, Climate, Moisture measurement, Water vapour, Integrated circuits
ICS31.080.01
CommitteeEPL/47
PublisherBSI
FormatA4
DeliveryYes
Pages28
File Size2.437 MB
NotesWarning: this draft is not current beyond its expiry date for comments.
Price£20.00


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