PD IEC/TR 63133:2017 - Semiconductor devices. Scan based ageing level estimation for semiconductor devices

PD IEC/TR 63133:2017

Semiconductor devices. Scan based ageing level estimation for semiconductor devices

Status : Current   Published : January 2018

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IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.




Standard NumberPD IEC/TR 63133:2017
TitleSemiconductor devices. Scan based ageing level estimation for semiconductor devices
StatusCurrent
Publication Date29 January 2018
Normative References(Required to achieve compliance to this standard)IEEE 1149.1:2013
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC TR 63133:2017
DescriptorsElectronic equipment and components, Storage, Performance, Estimation, Semiconductor devices
ICS31.080.01
CommitteeEPL/47
ISBN978 0 580 98851 6
PublisherBSI
FormatA4
DeliveryYes
Pages20
File Size1.426 MB
Price£130.00


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