BS EN IEC 62433-6:2020 - EMC IC modelling. Models of integrated circuits for Pulse immunity behavioural simulation. Conducted Pulse Immunity (ICIM-CPI)

BS EN IEC 62433-6:2020

EMC IC modelling. Models of integrated circuits for Pulse immunity behavioural simulation. Conducted Pulse Immunity (ICIM-CPI)

Status : Current   Published : November 2020

Format
PDF

Format
HARDCOPY



IEC 62433-6:2020 describes the extraction flow for deriving an immunity macro-model of an Integrated Circuit (IC) against conducted Electrostatic Discharge (ESD) according to IEC 61000-4-2 and Electrical Fast Transients (EFT) according to IEC 61000-4-4. The model addresses physical damages due to overvoltage, thermal damage and other failure modes. Functional failures can also be addressed. This model allows the immunity simulation of the IC in an application. This model is commonly called "Integrated Circuit Immunity Model Conducted Pulse Immunity", ICIM-CPI. This document provides: - the description of ICIM-CPI macro-model elements representing electrical, thermal or logical behaviour of the IC. - a universal data exchange format based on XML.




Standard NumberBS EN IEC 62433-6:2020
TitleEMC IC modelling. Models of integrated circuits for Pulse immunity behavioural simulation. Conducted Pulse Immunity (ICIM-CPI)
StatusCurrent
Publication Date11 November 2020
Normative References(Required to achieve compliance to this standard)IEC 62433-4:2016, IEC 62433-1, EN 62433-4, IEC 61000-4-4, EN 61000-4-2, EN IEC 62433-1, IEC 62433-4, EN 62215-3, IEC 62615, EN 61000-4-4, IEC 62215-3, IEC 61000-4-2
Informative References(Provided for Information)CISPR 17, EN 55017, IEC 62433-2:2017, EN 62433-2:2017, IEC 60050-131:2002/AMD1:2008, IEC 60050-131:2002/AMD3:2019, IEC 60050-131:2002/AMD2:2013, IEC 60050-131:2002, EN IEC 55016-1-4:2019, CISPR 16-1-4:2019
International RelationshipsEN IEC 62433-6:2020,IEC 62433-6:2020
Draft Superseded By18/30361563 DC19/30392352 DC
DescriptorsSimulation, Printed-circuit boards, Electromagnetic fields, Emission, Electromagnetic compatibility, Electronic equipment and components, Mathematical models, Electrical conductance, Electric terminals, Noise (spurious signals), Integrated circuits
ICS31.200
33.100.10
Title in FrenchModèles de circuits intégrés pour la CEM Modèles de circuits intégrés pour la simulation du comportement d'immunité aux impulsions. Modélisation de l'immunité aux impulsions conduite (ICIM-CPI)
Title in GermanEMV-IC-Modellierung Modelle integrierter Schaltungen für die Simulation des Verhaltens bei Störfestigkeit gegen Impulse. Modellierung der Störfestigkeit gegen leitungsgeführte Impulse (ICIM-CPI)
CommitteeEPL/47
ISBN978 0 580 98772 4
PublisherBSI
FormatA4
DeliveryYes
Pages60
File Size2.783 MB
Price£260.00


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