BS EN IEC 60749-12:2018 - Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency

BS EN IEC 60749-12:2018

Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency

Status : Current   Published : April 2018

Format
PDF

Format
HARDCOPY



IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages


This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:


a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.






Standard NumberBS EN IEC 60749-12:2018
TitleSemiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency
StatusCurrent
Publication Date18 April 2018
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)MIL-STD-883J:2007, IEC 60068-2-6, EN 60068-2-6, JESD22-B103
ReplacesBS EN 60749-12:2002
International RelationshipsEN IEC 60749-12:2018,IEC 60749-12:2017
DescriptorsClimate, Frequencies, Mechanical testing, Electronic equipment and components, Environmental testing, Vibration testing, Destructive testing, Integrated circuits, Semiconductor devices, Variable
ICS31.080.01
Title in FrenchDispositifs à semiconducteurs. Méthodes d’essais mécaniques et climatiques Vibrations, fréquences variables
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Prüfverfahren Schwingen, variable Frequenz
CommitteeEPL/47
ISBN978 0 580 98682 6
PublisherBSI
FormatA4
DeliveryYes
Pages12
File Size514 KB
Price£110.00


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