BS EN IEC 60749-13:2018 - Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere

BS EN IEC 60749-13:2018

Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere

Status : Current   Published : April 2018



IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.

This edition includes the following significant technical changes with respect to the previous edition:

a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

Standard NumberBS EN IEC 60749-13:2018
TitleSemiconductor devices. Mechanical and climatic test methods. Salt atmosphere
Publication Date30 April 2018
Normative References(Required to achieve compliance to this standard)IEC 60749-14, EN 60749-14
Informative References(Provided for Information)MIL-STD-883J
ReplacesBS EN 60749-13:2002
International RelationshipsEN IEC 60749-13:2018,IEC 60749-13:2018
DescriptorsDestructive testing, Environmental testing, Salt-spray tests, Electronic equipment and components, Mechanical testing, Accelerated corrosion tests, Climate, Integrated circuits, Accelerated testing, Salts, Corrosion resistance, Semiconductor devices
Title in FrenchDispositifs à semiconducteurs. Méthodes d’essais mécaniques et climatiques Atmosphère saline
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Prüfverfahren Salzatmosphäre
ISBN978 0 580 98422 8
File Size1.9 MB

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