BS EN IEC 60749-26:2018 - Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

BS EN IEC 60749-26:2018

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

Status : Current   Published : April 2018

Format
PDF

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HARDCOPY






Standard NumberBS EN IEC 60749-26:2018
TitleSemiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
StatusCurrent
Publication Date30 April 2018
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)EN 60749-27, IEC 60749, EN 60749, IEC 60749-27, ANSI/ESDA/JEDEC JS-001:2014
ReplacesBS EN 60749-26:2014
International RelationshipsEN IEC 60749-26:2018,IEC 60749-26:2018
Draft Superseded By17/30356569 DC
DescriptorsSemiconductor devices, Electronic equipment and components, Degradation, Sensitivity, Climate, Integrated circuits, Electrostatics, Environmental testing, Human body, Test models, Grades (quality), Mechanical testing, Damage, Electrical testing, Classification systems
ICS31.080.01
Title in FrenchDispositifs à semiconducteurs. Méthodes d'essais mécaniques et climatiques Essai de sensibilité aux décharges électrostatiques (DES). Modèle du corps humain (HBM)
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Prüfverfahren Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD). Human Body Model (HBM)
CommitteeEPL/47
ISBN978 0 580 97604 9
PublisherBSI
FormatA4
DeliveryYes
Pages54
File Size2.733 MB
Price£254.00


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