19/30355742 DC - BS IEC 62899-503. Printed Electronics. Part 503. Quality Assessment. Test method for the channel properties of the printed thin-film transistor

19/30355742 DC

BS IEC 62899-503. Printed Electronics. Part 503. Quality Assessment. Test method for the channel properties of the printed thin-film transistor

Status : Current, Draft for public comment   Published : April 2019

Format
PDF

Format
HARDCOPY






Standard Number19/30355742 DC
TitleBS IEC 62899-503. Printed Electronics. Part 503. Quality Assessment. Test method for the channel properties of the printed thin-film transistor
StatusCurrent, Draft for public comment
Publication Date26 April 2019
Normative References(Required to achieve compliance to this standard)IEC 62860-1:2013, IEC 62860:2013, IEEE Std 1620-2008, IEC 60050-521, IEEE Std 1620.1-2006, IEC/TS 62607-5-1
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC 62899-503 Ed.1.0
Draft Expiry Date12 June 2019
DescriptorsLED, Test equipment, Electronic devices, Electronic equipment and components, Testing
ICS29.220.10
29.220.30
29.220.99
CommitteeAMT/9
PublisherBSI
FormatA4
DeliveryYes
Pages15
File Size644 KB
NotesWarning: this draft is not current beyond its expiry date for comments.
Price£20.00


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