BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices. Test method for sheet resistance of flexible conducting films

BS IEC 62951-6:2019

Semiconductor devices. Flexible and stretchable semiconductor devices. Test method for sheet resistance of flexible conducting films

Status : Current   Published : May 2019

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PDF

Format
HARDCOPY



What is this standard about?

This part of IEC 62951 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.




Standard NumberBS IEC 62951-6:2019
TitleSemiconductor devices. Flexible and stretchable semiconductor devices. Test method for sheet resistance of flexible conducting films
StatusCurrent
Publication Date15 May 2019
Normative References(Required to achieve compliance to this standard)ISO 291:2008
Informative References(Provided for Information)IEC 62951-1 Ed.1.0
International RelationshipsIEC 62951-6:2019
Draft Superseded By19/30355442 DC
DescriptorsBend testing, Thin films, Measurement, Test methods, Semiconductor devices
ICS31.080.99
Title in FrenchDispositifs à semiconducteurs. Dispositifs à semiconducteurs souples et extensibles Méthode d’essai pour la résistance de couche des couches conductrices souples
CommitteeEPL/47
ISBN978 0 580 97293 5
PublisherBSI
FormatA4
DeliveryYes
Pages28
File Size1.53 MB
Price£182.00


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