BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices. Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices

BS IEC 62951-4:2019

Semiconductor devices. Flexible and stretchable semiconductor devices. Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices

Status : Current   Published : March 2019

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PDF

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HARDCOPY



What is this standard about?

This part of IEC 62951 specifies an evaluation method of the bending fatigue properties of conductive thin film and flexible substrate for the application at flexible semiconductor devices. The films include any films deposited or bonded onto a non-conductive flexible substrate such as thin metal film, transparent conducting electrode, and thin silicon film used for flexible semiconductor devices. The electrical and mechanical behaviours of films on the substrate are evaluated. The fatigue test methods include dynamic bending fatigue test and static bending fatigue test.




Standard NumberBS IEC 62951-4:2019
TitleSemiconductor devices. Flexible and stretchable semiconductor devices. Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
StatusCurrent
Publication Date05 March 2019
Normative References(Required to achieve compliance to this standard)IEC 62047-2:2006
Informative References(Provided for Information)IEC 62047-22:2014, IEC 62047-12:2011, IEC 62715-1-1:2013, IEC 62951-1
International RelationshipsIEC 62951-4:2019
DescriptorsTests, Thin films, Evaluation, Fatigue, Semiconductor devices
ICS31.080.99
Title in FrenchDispositifs à semiconducteurs. Dispositifs à semiconducteurs souples et extensibles Evaluation de la fatigue pour les couches minces conductrices souples sur les substrats pour dispositifs à semiconducteurs souples
CommitteeEPL/47
ISBN978 0 580 97290 4
PublisherBSI
FormatA4
DeliveryYes
Pages16
File Size1.059 MB
Price£130.00


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