BS IEC 62951-3:2018

BS IEC 62951-3:2018

Semiconductor devices. Flexible and stretchable semiconductor devices. Evaluation of thin film transistor characteristics on flexible substrates under bulging

Status : Current   Published : November 2018

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What is this standard about?

This part of IEC 62951 specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.




Standard NumberBS IEC 62951-3:2018
TitleSemiconductor devices. Flexible and stretchable semiconductor devices. Evaluation of thin film transistor characteristics on flexible substrates under bulging
StatusCurrent
Publication Date15 November 2018
Normative References(Required to achieve compliance to this standard)IEC 60747-8, IEC 62047-17
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC 62951-3:2018
Draft Superseded By17/30355386DC
DescriptorsElastomers, Polyimides, Polyethylene terephthalate, Substrates (insulating), Evaluation, Semiconductor devices, Electronic equipment and components
ICS31.080.99
CommitteeEPL/47
ISBN978 0 580 97278 2
PublisherBSI
FormatA4
DeliveryYes
Pages26
File Size1.278 MB
Price£182.00


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