19/30350992 DC - BS EN IEC 60749-41. Semiconductor devices. Mechanical and climatic test methods. Part 41. Standard reliability testing methods of non-volatile memory devices

19/30350992 DC

BS EN IEC 60749-41. Semiconductor devices. Mechanical and climatic test methods. Part 41. Standard reliability testing methods of non-volatile memory devices

Status : Current, Draft for public comment   Published : August 2019

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Standard Number19/30350992 DC
TitleBS EN IEC 60749-41. Semiconductor devices. Mechanical and climatic test methods. Part 41. Standard reliability testing methods of non-volatile memory devices
StatusCurrent, Draft for public comment
Publication Date29 August 2019
Normative References(Required to achieve compliance to this standard)IEC 60749-23, IEC 60749-6
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC 60749-41 Ed.1.0
Draft Expiry Date15 October 2019
DescriptorsElectric terminals, Electrical testing, Endurance testing, Test specimens, Thermal-shock tests, Environmental testing, Strength of materials, Mass spectrometry, Classification systems, Integrated circuits, Damp-heat tests, Shear testing, Low-pressure tests, Thermal testing, Mechanical testing, Leak tests, Radioactive tracer methods, Electronic equipment and components, Pull-out tests, Dimensional measurement, Torsion testing, Bonding, Accelerated testing, Semiconductor devices, Specimen preparation, Temperature measurement, Vibration testing, Test equipment, Fire tests, Stress, Marking, Visual inspection (testing), Testing conditions, Storage, Solderability testing, Defects, Moisture measurement, Flammability
ICS31.080.01
CommitteeEPL/47
PublisherBSI
FormatA4
DeliveryYes
Pages21
File Size331 KB
NotesWarning: this draft is not current beyond its expiry date for comments.
Price£20.00


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