Standard Number | BS EN 60749-5:2017 |
Title | Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test |
Status | Current |
Publication Date | 20 July 2017 |
Normative References(Required to achieve compliance to this standard) | EN 60749-4:2017, IEC 60749-4:2017 |
Informative References(Provided for Information) | No other standards are informatively referenced |
Replaces | BS EN 60749-5:2003 |
International Relationships | EN 60335-2-9:2003/A13:2010/AC:,EN 60749-5:2017,IEC 60749-5:2017 |
Draft Superseded By | 16/30348576 DC |
Descriptors | Humidity, Temperature, Mechanical testing, Test methods, Semiconductor devices |
ICS | 31.080.01
|
Title in French | Dispositifs à semiconducteurs. Méthodes d'essais mécaniques et climatiques Essai continu de durée de vie sous température et humidité avec polarisation |
Title in German | Halbleiterbauelemente. Mechanische und klimatische Prüfverfahren Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung |
Committee | EPL/47 |
ISBN | 978 0 580 95800 7 |
Publisher | BSI |
Format | A4 |
Delivery | Yes |
Pages | 16 |
File Size | 920 KB |
Price | £134.00 |