BS EN 60749-5:2017 - Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test

BS EN 60749-5:2017

Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test

Status : Current   Published : July 2017

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HARDCOPY



This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

This test method is considered destructive.




Standard NumberBS EN 60749-5:2017
TitleSemiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test
StatusCurrent
Publication Date20 July 2017
Normative References(Required to achieve compliance to this standard)EN 60749-4:2017, IEC 60749-4:2017
Informative References(Provided for Information)No other standards are informatively referenced
ReplacesBS EN 60749-5:2003
International RelationshipsEN 60335-2-9:2003/A13:2010/AC:,EN 60749-5:2017,IEC 60749-5:2017
Draft Superseded By16/30348576 DC
DescriptorsHumidity, Temperature, Mechanical testing, Test methods, Semiconductor devices
ICS31.080.01
Title in FrenchDispositifs à semiconducteurs. Méthodes d'essais mécaniques et climatiques Essai continu de durée de vie sous température et humidité avec polarisation
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Prüfverfahren Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung
CommitteeEPL/47
ISBN978 0 580 95800 7
PublisherBSI
FormatA4
DeliveryYes
Pages16
File Size920 KB
Price£134.00


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