| Standard Number | BS EN 60749-5:2017 |
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| Title | Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test |
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| Status | Current |
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| Publication Date | 20 July 2017 |
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| Normative References(Required to achieve compliance to this standard) | EN 60749-4:2017, IEC 60749-4:2017 |
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| Informative References(Provided for Information) | No other standards are informatively referenced |
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| Replaces | BS EN 60749-5:2003 |
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| International Relationships | EN 60335-2-9:2003/A13:2010/AC:,EN 60749-5:2017,IEC 60749-5:2017 |
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| Draft Superseded By | 16/30348576 DC |
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| Descriptors | Humidity, Temperature, Mechanical testing, Test methods, Semiconductor devices |
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| ICS | 31.080.01
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| Title in French | Dispositifs à semiconducteurs. Méthodes d'essais mécaniques et climatiques Essai continu de durée de vie sous température et humidité avec polarisation |
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| Title in German | Halbleiterbauelemente. Mechanische und klimatische Prüfverfahren Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung |
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| Committee | EPL/47 |
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| ISBN | 978 0 580 95800 7 |
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| Publisher | BSI |
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| Format | A4 |
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| Delivery | Yes |
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| Pages | 16 |
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| File Size | 920 KB |
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| Price | £134.00 |
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