BS IEC 60747-18-1:2019 - Semiconductor devices. Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors

BS IEC 60747-18-1:2019

Semiconductor devices. Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors

Status : Current   Published : June 2019

Format
PDF

Format
HARDCOPY



IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.




Standard NumberBS IEC 60747-18-1:2019
TitleSemiconductor devices. Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors
StatusCurrent
Publication Date07 June 2019
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)IEC 60747-14-5:2010, IEC 60050-845:1987, IEC 60747-14-1:2010, IEC 60747-1:2006/AMD1:2010, IEC 60747-1:2006, IEC 60749, IEC 60747-18-2, IEC 60747-18-3
International RelationshipsIEC 60747-18-1:2019
Draft Superseded By19/30348426 DC
DescriptorsCalibration, Data analysis, Test methods, Sensors, Semiconductor devices
ICS31.080.99
CommitteeEPL/47
ISBN978 0 580 95779 6
PublisherBSI
FormatA4
DeliveryYes
Pages30
File Size2.19 MB
Price£182.00


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