PD IEC TS 62876-2-1:2018 - Nanotechnology. Reliability assessment. Nano-enabled photovoltaic devices. Stability test

PD IEC TS 62876-2-1:2018

Nanotechnology. Reliability assessment. Nano-enabled photovoltaic devices. Stability test

Status : Current   Published : September 2018

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IEC TS 62876-2-1:2018 establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.




Standard NumberPD IEC TS 62876-2-1:2018
TitleNanotechnology. Reliability assessment. Nano-enabled photovoltaic devices. Stability test
StatusCurrent
Publication Date04 September 2018
Normative References(Required to achieve compliance to this standard)ISO 4892-2:2013, IEC 60068-2-78, ISO 4892-1, ISO 877-1, ISO 9370, IEC 60904-9, IEC 60904-1, ISO/IEC 17025, IEC 60068-2-2
Informative References(Provided for Information)IEC 60721-2-1
International RelationshipsIEC TS 62876-2-1:2018
DescriptorsPerformance, Stability, Stability testing, Reliability, Nanotechnology
ICS07.120
27.160
CommitteeNTI/1
ISBN978 0 580 95741 3
PublisherBSI
FormatA4
DeliveryYes
Pages34
File Size1.094 MB
Price£214.00


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