ASTM F3166 - 16 - Standard Specification for High-Purity Titanium Sputtering Target Used for Through-Silicon Vias (TSV) Metallization

ASTM F3166 - 16

Standard Specification for High-Purity Titanium Sputtering Target Used for Through-Silicon Vias (TSV) Metallization

Status : Current   Published : May 2016

Format
PDF

Format
HARDCOPY



1.1 This specification details the generic criteria requirements of high pure titanium sputtering targets used as thin film material for through-silicon vias (TSV) metallization in advance packaging.

1.2 Sputtering target purity, grain size, inner quality, bonding, dimension, and appearance specifications are included in this specification along with references for qualification test methods. Reliability, certification, traceability, and packaging requirements are also included.

1.2.1  Purity Requirements: 

1.2.1.1 Metallic element impurities, and

1.2.1.2 Non-metallic element impurities.

1.2.2  Grain Size Requirements—Grain size.

1.2.3  Inner Quality Requirements—Internal defect.

1.2.4  Bonding Requirements: 

1.2.4.1 Backing plate, and

1.2.4.2 Bonding ratio.

1.2.5  Configuration Requirements: 

1.2.5.1 Dimension,

1.2.5.2 Tolerance, and

1.2.5.3 Surface roughness.

1.2.6  Appearance Requirements—Surface cleanness.

1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.4  This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.




Standard NumberASTM F3166 - 16
TitleStandard Specification for High-Purity Titanium Sputtering Target Used for Through-Silicon Vias (TSV) Metallization
StatusCurrent
Publication Date01 May 2016
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Descriptors high-purity titanium, sputtering target, TSV metallization
ICS25.220.40
31.120
PublisherASTM
FormatA4
DeliveryYes
Pages5
File Size109 KB
Price£40.00


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