ASTM C1842 - 16 - Standard Test Method for The Analysis of Boron and Silicon in Uranium Hexfluoride via Fourier-Transform Infrared (FTIR) Spectroscopy

ASTM C1842 - 16

Standard Test Method for The Analysis of Boron and Silicon in Uranium Hexfluoride via Fourier-Transform Infrared (FTIR) Spectroscopy

Status : Current   Published : June 2016

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1.1 This test method is suitable for determining boron and silicon impurities as BF 3 and SiF 4 in uranium hexafluoride. This test method is an alternative to those described in Test Methods C761 and C1771.

1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3  This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.




Standard NumberASTM C1842 - 16
TitleStandard Test Method for The Analysis of Boron and Silicon in Uranium Hexfluoride via Fourier-Transform Infrared (FTIR) Spectroscopy
StatusCurrent
Publication Date01 June 2016
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Descriptors Boron, Fluoride compounds, Fourier-transform infrared spectroscopy, Silicon, Uranium hexafluoride
ICS27.120.30
PublisherASTM
FormatA4
DeliveryYes
Pages7
File Size179 KB
Price£40.00


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