BS ISO 25498:2018 - Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope

BS ISO 25498:2018

Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope

Status : Current   Published : March 2018

Format
PDF

Format
HARDCOPY






Standard NumberBS ISO 25498:2018
TitleMicrobeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
StatusCurrent
Publication Date23 March 2018
Normative References(Required to achieve compliance to this standard)ISO/IEC 17025
Informative References(Provided for Information)ISO 15932:2013, ASTM E 3-11
ReplacesBS ISO 25498:2010
International RelationshipsISO 25498:2018
Draft Superseded By17/30343628 DC
DescriptorsChemical analysis and testing, Electron diffraction, Spectroscopy, Test specimens, Microanalysis, Crystal lattices, Electron microscopes, Electron beams, Optical instruments
ICS71.040.50
Title in FrenchAnalyse par microfaisceaux. Microscopie électronique analytique. Analyse par diffraction par sélection d'aire au moyen d'un microscope électronique en transmission
CommitteeCII/9
ISBN978 0 580 94692 9
PublisherBSI
FormatA4
DeliveryYes
Pages48
File Size1.827 MB
Price£240.00


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