PD IEC/TS 62804-1:2015 - Photovoltaic (PV) modules. Test methods for the detection of potential-induced degradation. Crystalline silicon

PD IEC/TS 62804-1:2015

Photovoltaic (PV) modules. Test methods for the detection of potential-induced degradation. Crystalline silicon

Status : Current   Published : September 2015

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PDF

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IEC TS 62804-1:2015(E) defines procedures to test and evaluate the durability of crystalline silicon photovoltaic (PV) modules to the effects of short-term high-voltage stress including potential-induced degradation (PID). Two test methods are defined that do not inherently produce equivalent results. They are given as screening tests; neither test includes all the factors existing in the natural environment that can affect the PID rate. The methods describe how to achieve a constant stress level. The testing in this Technical Specification is designed for crystalline silicon PV modules with one or two glass surfaces, silicon cells having passivating dielectric layers, for degradation mechanisms involving mobile ions influencing the electric field over the silicon semiconductor, or electronically interacting with the silicon semiconductor itself.




Standard NumberPD IEC/TS 62804-1:2015
TitlePhotovoltaic (PV) modules. Test methods for the detection of potential-induced degradation. Crystalline silicon
StatusCurrent
Publication Date30 September 2015
Normative References(Required to achieve compliance to this standard)IEC 60068-2-78:2012, IEC 61730-2:2004, ISO/IEC 17025, IEC 61215:2005, IEC 60410
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC/TS 62804-1 Ed.1.0
DescriptorsPhotoelectric devices, Equipment safety, Electrical safety, Photoelectric cells, Fire safety, Solar power, Electrical components, Classification systems, Photovoltaic cells, Qualification approval, Solar cells, Electric shocks
ICS27.160
CommitteeGEL/82
ISBN978 0 580 91563 5
PublisherBSI
FormatA4
DeliveryYes
Pages20
File Size1.16 MB
Price£130.00


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