BS IEC 63003:2015 - Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505<sup>TM</sup>

BS IEC 63003:2015

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM

Status : Current   Published : January 2016

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IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.




Standard NumberBS IEC 63003:2015
TitleStandard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM
StatusCurrent
Publication Date31 January 2016
Normative References(Required to achieve compliance to this standard)IEEE Std 1505-2006
Informative References(Provided for Information)MIL-HDBK-217, EIA/ECA-310-E:2005, IEEE Std 991-1986, IEEE Std 260.1-2004, IEEE/ASTM SI 10-2002, IEEE Std 945-1984, IEEE Std 260.3-1993, IEEE Std 1014-1987, MIL-DTL-55302/179-180, MIL-PRF-28800, IEEE Std 1149.1-2001, MIL-C-83733, IEEE Std 280-1982, IEEE Std 315-1975, IEEE 100
International RelationshipsIEC 63003:2015
DescriptorsRecords (documents), Data processing, Life cycle, Software engineering techniques, Data management, Documents, Information, Process control, Data, Life (durability), Computer software
ICS25.040.01
CommitteeEPL/501
ISBN978 0 580 91106 4
PublisherBSI
FormatA4
DeliveryYes
Pages174
File Size5.012 MB
Price£350.00


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