15/30323630 DC - BS EN 62047-28. Semiconductor devices. Micro-electromechanical devices. Part 28. Performance testing method of vibration–driven MEMS electret energy harvesting devices

15/30323630 DC

BS EN 62047-28. Semiconductor devices. Micro-electromechanical devices. Part 28. Performance testing method of vibration–driven MEMS electret energy harvesting devices

Status : Current, Draft for public comment   Published : April 2015

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Standard Number15/30323630 DC
TitleBS EN 62047-28. Semiconductor devices. Micro-electromechanical devices. Part 28. Performance testing method of vibration–driven MEMS electret energy harvesting devices
StatusCurrent, Draft for public comment
Publication Date08 April 2015
Normative References(Required to achieve compliance to this standard)IEC 60749-12:2009
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC Document 47F/220/CD
Draft Expiry Date01 May 2015
DescriptorsSemiconductor devices, Electronic equipment and components, Electromechanical devices, Semiconductor technology, Integrated circuits, Thin-film devices, Fatigue testing, Bend testing, Resonance, Vibration, Test specimens, Test equipment
ICS01.080.99
CommitteeEPL/47
PublisherBSI
FormatA4
DeliveryYes
Pages16
File Size1.05 MB
NotesWarning: this draft is not current beyond its expiry date for comments.
Price£20.00


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