PD IEC/TS 62916:2017 - Photovoltaic modules. Bypass diode electrostatic discharge susceptibility testing

PD IEC/TS 62916:2017

Photovoltaic modules. Bypass diode electrostatic discharge susceptibility testing

Status : Current   Published : June 2017

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PDF

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IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.




Standard NumberPD IEC/TS 62916:2017
TitlePhotovoltaic modules. Bypass diode electrostatic discharge susceptibility testing
StatusCurrent
Publication Date28 June 2017
Normative References(Required to achieve compliance to this standard)IEC 61000-4-2:2008
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC TS 62916:2017
DescriptorsSusceptibility (magnetic), Dimensions, Photovoltaic cells
ICS27.160
CommitteeGEL/82
ISBN978 0 580 89679 8
PublisherBSI
FormatA4
DeliveryYes
Pages16
File Size871 KB
Price£130.00


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