BS ISO 20263:2017 - Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

BS ISO 20263:2017

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

Status : Current   Published : January 2018

Format
PDF

Format
HARDCOPY






Standard NumberBS ISO 20263:2017
TitleMicrobeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
StatusCurrent
Publication Date04 January 2018
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)ISO 15932:2013, ISO 29301:2010, ISO/IEC Guide 98-3
International RelationshipsISO 20263:2017
Draft Superseded By16/30319120 DC
DescriptorsElectron microscopes, Materials by form, Analysis, Interfaces, Measurement
ICS37.020
71.040.50
Title in FrenchAnalyse par microfaisceaux. Microscopie électronique analytique. Méthode de détermination de la position d'interface dans l'image de coupe transversale des matériaux en couches
CommitteeCII/9
ISBN978 0 580 89345 2
PublisherBSI
FormatA4
DeliveryYes
Pages54
File Size4.677 MB
Price£254.00


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