18/30319114 DC - BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)

18/30319114 DC

BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)

Status : Current, Draft for public comment   Published : June 2018

Format
PDF

Format
HARDCOPY






Standard Number18/30319114 DC
TitleBS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
StatusCurrent, Draft for public comment
Publication Date08 June 2018
Normative References(Required to achieve compliance to this standard)ISO 12234-2:2001, ISO 12639:2004, ISO 22493:2014
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsISO 20171,ISO/DIS 20171
Draft Expiry Date24 July 2018
DescriptorsElectron beams, Magnification, Microscopes, Control samples, Electron optics, Calibration, Optical phenomena, Accuracy, Electron microscopes, Scanning electron microscopes, Optical instruments
ICS35.240.70
37.020
Title in FrenchFormat TIFF pour microscopie à balayage électronique (TIFF/SEM)
CommitteeCII/9
PublisherBSI
FormatA4
DeliveryYes
Pages46
File Size478 KB
NotesWarning: this draft is not current beyond its expiry date for comments.
Price£20.00


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