Standard Number | 18/30319114 DC |
Title | BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM) |
Status | Current, Draft for public comment |
Publication Date | 08 June 2018 |
Normative References(Required to achieve compliance to this standard) | ISO 12234-2:2001, ISO 12639:2004, ISO 22493:2014 |
Informative References(Provided for Information) | No other standards are informatively referenced |
International Relationships | ISO 20171,ISO/DIS 20171 |
Draft Expiry Date | 24 July 2018 |
Descriptors | Electron beams, Magnification, Microscopes, Control samples, Electron optics, Calibration, Optical phenomena, Accuracy, Electron microscopes, Scanning electron microscopes, Optical instruments |
ICS | 35.240.70 37.020
|
Title in French | Format TIFF pour microscopie à balayage électronique (TIFF/SEM) |
Committee | CII/9 |
Publisher | BSI |
Format | A4 |
Delivery | Yes |
Pages | 46 |
File Size | 478 KB |
Notes | Warning: this draft is not current beyond its expiry date for comments. |
Price | £20.00 |