| Standard Number | 18/30319114 DC |
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| Title | BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM) |
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| Status | Current, Draft for public comment |
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| Publication Date | 08 June 2018 |
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| Normative References(Required to achieve compliance to this standard) | ISO 12234-2:2001, ISO 12639:2004, ISO 22493:2014 |
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| Informative References(Provided for Information) | No other standards are informatively referenced |
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| International Relationships | ISO 20171,ISO/DIS 20171 |
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| Draft Expiry Date | 24 July 2018 |
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| Descriptors | Electron beams, Magnification, Microscopes, Control samples, Electron optics, Calibration, Optical phenomena, Accuracy, Electron microscopes, Scanning electron microscopes, Optical instruments |
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| ICS | 35.240.70
37.020
|
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| Title in French | Format TIFF pour microscopie à balayage électronique (TIFF/SEM) |
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| Committee | CII/9 |
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| Publisher | BSI |
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| Format | A4 |
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| Delivery | Yes |
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| Pages | 46 |
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| File Size | 478 KB |
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| Notes | Warning: this draft is not current beyond its expiry date for comments. |
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| Price | £20.00 |
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