BS ISO 16700:2016 - Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

BS ISO 16700:2016

Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

Status : Current   Published : July 2016

Format
PDF

Format
HARDCOPY






Standard NumberBS ISO 16700:2016
TitleMicrobeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
StatusCurrent
Publication Date31 July 2016
Normative References(Required to achieve compliance to this standard)ISO/IEC 17025:2005, ISO Guide 30, ISO Guide 34, ISO Guide 35
Informative References(Provided for Information)ISO 5725-1, ISO/IEC Guide 98-3, GUM:1995
ReplacesBS ISO 16700:2004
International RelationshipsISO 16700:2016
Draft Superseded By15/30317578 DC
DescriptorsScanning electron microscopes, Electron microscopes, Microscopes, Optical instruments, Electron optics, Electron beams, Magnification, Optical phenomena, Calibration, Control samples, Accuracy
ICS37.020
Title in FrenchAnalyse par microfaisceaux. Microscopie électronique à balayage. Lignes directrices pour l’étalonnage du grandissement d’image
CommitteeCII/9
ISBN978 0 580 89052 9
PublisherBSI
FormatA4
DeliveryYes
Pages30
File Size4.027 MB
Price£182.00


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