ASTM E1829 - 14 - Standard Guide for Handling Specimens Prior to Surface Analysis

ASTM E1829 - 14

Standard Guide for Handling Specimens Prior to Surface Analysis

Status : Current   Published : January 2014



1.1 This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines:

1.1.1 Auger electron spectroscopy (AES),

1.1.2 X-ray photoelectron spectroscopy (XPS or ESCA), and

1.1.3 Secondary ion mass spectrometry (SIMS).

1.1.4 Although primarily written for AES, XPS, and SIMS, these methods may also apply to many surface-sensitive analysis methods, such as ion scattering spectrometry, low-energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface-sensitive measurements.

1.2  This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard NumberASTM E1829 - 14
TitleStandard Guide for Handling Specimens Prior to Surface Analysis
Publication Date10 January 2014
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Descriptors Auger electron spectroscopy, Secondary ion mass spectrometry, Specimen handling, Surface analysis, X-ray photoelectron spectroscopy
File Size78 KB

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