PD IEC/TS 62686-1:2015 - Process management for avionics. Electronic components for aerospace, defence and high performance (ADHP) applications. General requirements for high reliability integrated circuits and discrete semiconductors

PD IEC/TS 62686-1:2015

Process management for avionics. Electronic components for aerospace, defence and high performance (ADHP) applications. General requirements for high reliability integrated circuits and discrete semiconductors

Status : Current   Published : April 2015

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IEC TS 62686-1:2015(E) defines the minimum requirements for general purpose "off the shelf" COTS (commercial off-the-shelf) integrated circuits and discrete semiconductors for ADHP (aerospace, defence and high performance) applications. This Technical Specification applies to all components that can be operated in ADHP applications within the manufacturers' publicly available data sheet limits in conjunction with IEC TS 62239-1. It may be used by other high performance and high reliability industries, at their discretion. This new edition includes the following significant technical changes with respect to the previous edition:


- adoption and modification of STACK Specification S/0001 revision 14 notice 3, update of IEC semiconductor test methods;


- update of JEDEC semiconductor test methods;


- including addition of JEP148A, based on the Physics of Failure Risk and Opportunity assessment;


- update of Annex A with additional JEDEC and IEC test information;


- revision of lead-free termination finish requirements.




Standard NumberPD IEC/TS 62686-1:2015
TitleProcess management for avionics. Electronic components for aerospace, defence and high performance (ADHP) applications. General requirements for high reliability integrated circuits and discrete semiconductors
StatusCurrent
Publication Date30 April 2015
Normative References(Required to achieve compliance to this standard)JESD471, IPC/JEDEC J-STD-609, JEP130, TL 9000, IPC/JEDEC J-STD-033, JEDEC/IPC/ECIA J-STD-048, IPC/JEDEC J-STD-020, JESD46, ISO TS 16949, ISO 9001, ISO 9001:2008, ANSI/EIA-556, ANSI/ESD S541, AS/EN/JISQ 9100
Informative References(Provided for Information)JESD89, IEC TS 62564-1, IEC 60749-22, JESD36, JESD24, JESD22-B106, IEC 60749-20, MIL-STD-883, JESD22-B104, JESD89-1, JESD22-A117, JESD22-A103, IEC TS 62239-1, AEC-Q100-001, IEC 60749-36, JESD80, JEP119, AEC-Q100-005, IEC 60749-19, IEC 62416, ANSI/ESDA/JEDEC JS-001, SAE J1879/ZVEI, IEC 60749-25, JESD625, JESD22-A102, JESD531, JEP148, JESD86, JESD76-2, JESD76-1, JESD76, IEC 60749-26, JEP122, IEC 60749-33, JESD89-3, JESD22-B100, AEC-Q100, IEC 60749-12, IEC 61340-5-1, JESD282, JESD22-B107, IEC 62374-1, IEC 60749-8, JESD313, JESD22-A118, IEC 60695-11-5, JEP154, JESD22-A109, JESD22-A110, JESD24-4, IEC 62418, JESD76-3, IEC 60749-20-1, JESD22-A108, IEC 60749-21, IPC/JEDEC J-STD-035, IEC 60749-34, JESD22-A104, STACK Specification S/0001, JESD22-B101, JESD51-2, 2002/95/EC, MIL-STD-750, JESD52, JESD47, JESD51-1, UL94, JESD6, JESD89-2, IEC 60749-14, JESD22-B116, IEC 60749-23, JP001.01, IEC 62374, JESD213, IEC 60749-30, IEC 60749-15, IEC 60749-29, IEC 62417, JESD79-2, JESD85, JESD79-3, JESD94, JEP138, AEC-Q100-004, JESD22-B105, ANSI/ASQ Z1.4, IEC 60749-6:2017, IEC 60749-5:2017, IEC 60749-4:2017, IEC 60749-9:20
ReplacesPD IEC/TS 62686-1:2012
International RelationshipsIEC/TS 62686-1 Ed.2.0
DescriptorsIntegrated circuits, Electrical components, Qualification approval, Quality assurance systems, Assessed quality, Specification (approval), Semiconductors, Acceptance (approval), Aircraft components, Semiconductor devices, Electronic equipment and components
ICS03.100.50
31.020
49.060
CommitteeGEL/107
ISBN978 0 580 88254 8
PublisherBSI
FormatA4
DeliveryYes
Pages68
File Size1.444 MB
Price£254.00


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