BS EN 62433-4:2016 - EMC IC modelling. Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI)

BS EN 62433-4:2016

EMC IC modelling. Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI)

Status : Current   Published : November 2016

Format
PDF

Format
HARDCOPY



IEC 62433-4:2016 specifies a flow for deriving a macro-model to allow the simulation of the conducted immunity levels of an integrated circuit (IC). This model is commonly called Integrated Circuit Immunity Model - Conducted Immunity, ICIM-CI. It is intended to be used for predicting the levels of immunity to conducted RF disturbances applied on IC pins. In order to evaluate the immunity threshold of an electronic device, this macro-model will be inserted in an electrical circuit simulation tool. This macro-model can be used to model both analogue and digital ICs (input/output, digital core and supply). This macro-model does not take into account the non-linear effects of the IC. The added value of ICIM-CI is that it could also be used for immunity prediction at board and system level through simulations. This part of IEC 62433 has two main parts:


- the electrical description of ICIM-CI macro-model elements;


- a universal data exchange format called CIML based on XML. This format allows ICIM-CI to be encoded in a more useable and generic form for immunity simulation.




Standard NumberBS EN 62433-4:2016
TitleEMC IC modelling. Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI)
StatusCurrent
Publication Date30 November 2016
Normative References(Required to achieve compliance to this standard)EN 62132-1, IEC 62132-4, ISO/IEC 646:1991, IEC 62132-1, EN 55017, EN 62132-4, CISPR 17, ISO 8879:1986, IEC 62433-2:2017, EN 62433-2:2017
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsEN 61169-24:2009,EN 62433-4:2016,IEC 62433-4:2016
Draft Superseded By14/30310474 DC
DescriptorsElectronic equipment and components, Mathematical models, Electrical conductance, Noise (spurious signals), Emission, Electromagnetic fields, Simulation, Electromagnetic compatibility, Electric terminals, Printed-circuit boards, Integrated circuits
ICS31.200
Title in FrenchModèles de circuits intégrés pour la CEM. Modèles de circuits intégrés pour la simulation du comportement d'immunité aux radiofréquences. Modélisation de l'immunité conduite (ICIM-CI)
Title in GermanEMV-IC-Modellierung. Modelle integrierter Schaltungen für die Simulation des Verhaltens der HF-Störfestigkeit. Modellierung der Störfestigkeit gegen leitungsgeführte Störungen (ICIM-CI)
CommitteeEPL/47
ISBN978 0 580 87527 4
PublisherBSI
FormatA4
DeliveryYes
Pages112
File Size2.584 MB
Price£292.00


 Your basket
Your basket is empty

Multi-user access to over 3,500 medical device standards, regulations, expert commentaries and other documents


Worldwide Standards
We can source any standard from anywhere in the world


Tracked Changes

Understand the changes made to a standard with our new Tracked Changes version


Develop a PAS

Develop a fast-track standardization document in 9-12 months