BS 3494-2:1966 - Recommendations on semiconductors devices. Methods of measurement of the characteristics of diaode and transistors

BS 3494-2:1966

Recommendations on semiconductors devices. Methods of measurement of the characteristics of diaode and transistors

Status : Withdrawn   Published : February 1966

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Standard NumberBS 3494-2:1966
TitleRecommendations on semiconductors devices. Methods of measurement of the characteristics of diaode and transistors
StatusWithdrawn
Publication Date28 February 1966
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
ICS31.080.01
PublisherBSI
FormatA4
DeliveryNo
Pages64
File Size0 KB
Price£186.00


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