BS ISO 19830:2015 - Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

BS ISO 19830:2015

Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

Status : Current   Published : November 2015

Format
PDF

Format
HARDCOPY






Standard NumberBS ISO 19830:2015
TitleSurface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
StatusCurrent
Publication Date30 November 2015
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)ISO 18115–1, ISO 21270
International RelationshipsISO 19830:2015
Draft Superseded By15/30300681 DC
DescriptorsChemical analysis and testing, Surfaces, Surface properties, Vocabulary, Definitions, Spectroscopy
ICS71.040.40
Title in FrenchAnalyse chimique des surfaces. Spectroscopie d’électrons. Exigences minimales pour le rapport d’ajustement de pic en spectroscopie de photoélectrons X
CommitteeCII/60
ISBN978 0 580 86519 0
PublisherBSI
FormatA4
DeliveryYes
Pages34
File Size1.656 MB
Price£214.00


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